Negative Testing verifies the behavior of the system under test by providing invalid inputs. In this research, we applied the boundary values analysis technique on Java Smart Card Applications. This type of application is deployed in highly essential areas around us to support access, identity, payment and other services. We applied the Negative testing approach which does not only aim to show any potential defect that could cause a risky impact on the exhaustion of the application on the whole but can be instrumental in determining the conditions under which the application can crash. Negative Testing is evaluated on Six Smart Java Programs, and the results show that the presented approach can reveal faults and unexpected behavior in these programs.